Characterization


Structural and Morphological Characterization

We have two x-ray diffractometers in our lab: a High Resolution X-ray Diffractometer (HR-XRD) on the left, and D8 DISCOVER with DAVINCI on the right.


GADDS. Our X-ray General Area Detector Diffraction System (GADDS) is equipped with a 2-dimensional area detector which is capable of capturing many diffracted beams at the same time. This gives us the ability to quickly see what phases have formed and their degree of crystallinity.


AFM. Bruker multiscope with capabilities for a wide range of measurements including AFM, PFM, STM, MFM and more.

Electrical Measurements



(A) Capacitance and dielectric measurements:HP 4284A Precision LCR meter operating at 20 Hz ~ 1 MHz measures capacitance and dielectric properties.


(B) Current-Voltage measurements:Keithley 6517A Electrometer/High Resistance Meter.


(C, D) Ferroelectricity measurements:Ferroelectric characterization is performed by two tools that can perform ferroelectric hysteresis, retention, and fatigue tests. As shown above, they are Precision LC by Radiant Technologies. Inc: operating at 1 Hz - 2 kHz and Precision FH100 by Radiant Technologies. Inc: operating at 1kHz -1MHz.


(E) Keithley 4200-SCS.performs electrical characterization of materials, semiconductor devices and processes. From basic I-V and C-V measurement sweeps to advanced ultra-fast pulsed I-V, waveform capture, and transient I-V measurements


(F) Probe Station with microscope. The microscope is equipped with a Moticam digital sensor for capturing images of samples.

Magnetic Measurements


ST-FMR


Planar Hall Effect


Low Temperature Transport Measurements


4 K Closed Cycle Cryostat. Closed cycle helium cryostat for transport measurements. Capable of room temperate to 4K.